LED检验标准.docx
欧普照明OPP1.E品质检验标准PCBA/光源/支架/电子件欧普照明品质工程2014/11/30OPP1.EConfidentialQualityInspectionStandardREV:ROOPreparedBy:Raidy1.i/1.eoZhang/JingZhangCheckedBy:JohnYanREVCHANGEDESCRIPTIONUpdatedTimePREPAREDBYAPPROVEDBYRoOFirstRelease1330/2014RaidyZ1.eaJinq1.anq1.i书目NOTES&INSTRUCTION留&说明3SAMPuNGPIAN抽样安排;3CoSME“CIrvSPtciiONMeihod夕卜观检验方法，4TEsTINGMETHOO测试方法：SCriticai/Major/MWORDefectdffinition产岐/主/次缺陷的定义：5SCOPE（好用范阳）：5PCBA-BU1.BtMCAND1.EIMM12COMPACTF1.UORESCENT1.AMP节能灯172R21.ampmask/co-extrusiontube耐笊/共挤管20ENDCoVER/SideCover潮邮（M靛21METAlPAIVr铝材22UoPCBF1.RscENTTuee光源板/灯管23ACCESSORtFS/附件24FunctionTesting性能测试2526PACKAGINGNotes&Instruction留意事项及说明SamplingPlan抽样安排；- -照MI1.STD4916,抽样安持按Awl2进行抽检.TaketheA-IV1/12sampleplanrefertoMI1.-STD-1916- 亚续100%检264全PASS,将采纳前机抽样，频率为1/12.After264pcsPassed100%continuousinspected,changeto1/12sampleinspect.- 假如在全检264的过程中发觉不良,M屯新起先计取;假如IK新起先计欺后,在祖续264PcS的检验中仍III发觉fail之产品,则应当停止检蕤,宜到找到改善措施.Re-countiffounddefectoutofthefirst264p<s100%inspect,StopInspectingIffounddefectagainuntiltheRCCAfound.- 在抽检过程中发觉有不良品时，汇即通知生产税改善并对产品进行Sorting或返工;芹当前批次/M未满个批次之二分之一,则需往前追加一个批次,并与当前批次产品作Sorting或返工;?；当前批次股证超过一个批次之：分之一时,对该批次之产品作Sorting或返工.Thesortingactionwasneedediffounddefectinthesampling,ifcuentbatchqtywaslessthan1/2batchsize,needsortingcurrentbatchandthepreviousbatch;ifcurrentbatchqtywasmorethan1/2batchsize,needsortingcurrentbatch.- 花随机抽样安排期间,于执行5倍的样本大小过程中(此处的样本大小,应依照表2方式给予)发觉2个以上的不合格件，则转为加产抽检，频率按1/6执行.Iffindmorethan2defectsduring5*80pcsinspected(thesamplesizerefertofigure2),strictfrequentto1/6.- 在频率为1/6时仍发觉小NQQA将由抽样改为连续264全检，OQAwillchangetoIo0%samplingof264pcsiffinddefectunder1/6sampling.- 在加产检验过程中,假如在5倍的样本大小检验中无发觉不也,OQA将由加严检验转为班机抽样.IfnofinddefectduringS*80pcsinspected(thesamplesizerefertofigure2),changethesamplingtonormal.- 时于发生车律性间避谈严岐块陷，至少衙将当前批次及前两个批次的数状总和列为一个判退批;鼠Forreliabilityorcriticalissue,therejectbatchiscurrentbatchandprevioustwo.图I：转换流程表1连续性抽样计划样本代字(C1.)验证水平(V1.)VIVIVIn11I减量箭选阶段：筛选数量A386722D711345271255527NAB7061340217548423721808336NAC1133756092524123757224611653NAD1682784113957171481536815573NAE26912I18657092605110151322896NA抽样阶段：粉率A1/34/171/62/17,1/171/241/341/48B4/171/62/171/121/171/241/341/481/68C1/62/171/121/171/241/341/481/681/96D2/171/121/171/241/341/481/681冷61/136E1/121/171/241/341/481/681/961/1361/192表Il：i数位抽样安排样本代检蕤等级(V1.)字C1.T加严VllVlVIVIllIlIR减量样本大小(11a)A30721280512192803212S3B40%153664025696401663C51202048768320128482083D61442S6O10243841606424104E8192307212805121928032125注：(1)抽样检验的样本需从送检产品中随机抽样.若无不良则该批允收.否则拒收(Ac=O1Re=I).次缺不做为拒收标准,3个次法相当一个主缺.(2)假如送悔批用小于或等于样本数，则实行100%检骁，(3)牢粘性抽样参考相关产品的牢掩性抽样安排。CosmeticInspectionMethod外观检险方法t环境光线：在产品表面要有大于93FootCandIes(1.x)检者距离目视角度：不用放大镜，以45度角之内里向产品表面。在目视角度内产品可以旋转角度来检杳任何的跳陷,产品我曲目视距离刚好问300mm,5s每个面检验工具及参考资料:A.I：尺/二叫B,装配CH.品;D、BoM乩图纸;E.功率测试仪、功率测试仪,调压器、耐压测试仪、测试夹具、接地电阻测试仪.F、相关国标G.IPC610EInspectionTls:ArCaIiperZGauge;BrAssembiy;C:Sample;D:BOM/Drawing;E:PowerTester/PowerregulatorVoltageTesterFixtureGroundresistancetester.F:NationalStandard,G:IPC610ETestingMethod*箕方法t参考相关产品的技术标准及国际标准Critical/Major/Minordefectdefinition产咬/主/次候陪的定义tCriticalDefect-Thedefectwhichdamagecustomerorcarrier'slifeofsafety.严岬缺点凡有危宙制品的运用者或携带者的生命或平安之港在危急的缺点.MajorDefectarelikelytopreventthecircuitfromperformingitsintendedfunctiontodamageproduct.Toreduceproductlifetime.主缺点可能造成产品损坏,功能不良或影响材料.产品运用右命或用户需额外加工的缺点.MinorDefectareunlikelytocausecircuitfailure,andhavereativelittleeffectonappearanceormechanism.次缺点一事实上不影响制品的运用El的,但外观不良或机构组装的一些微不良或差异.Scope（好用茶图ThisdocumentisapplicationtoallproductswhicharemanufacturedinOPP1.EZhongShan.Ifthecriteriaisconflictwiththespecialrequestinotherdocument,pleasefollowthespecialrequestinotherdocument.此文件适用于在欧普中山所生产的产品，如此文件的标准跟其它文件的特殊要求有冲突,请遵循其它文件的特殊要求PCBA检验标准ITEM项目DESCRIPTION描述ReferemCePictureDEFINITION良品不良品CRIMAJMINITEM项目DESCRIPTION描述ReferencePictureDEFINITION良Ai不良品CRIMAJMINExtraparts多件Non-acceptance不允许None霾6ZWrongparts播件Non-acceptance不允许Missingparts漏件Non-acceptance不允许*三fWrongpolarity极性错误Checkcomponentspolaritymatchesthepartpolaritysymbolofsilk-screenexistingonPCB组件极性跟PCB上的标示不一样CToI飞Marking标示Componentsurfacebadprintingcan,tbedetermined组件本体标示出说或不能
